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Consolidated

IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2

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Abstract

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Products specifications

  • Consolidated from IEC
  • Published:
  • Withdrawn:
  • Edition: 2.2
  • Document type: IS
  • Pages
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 31.080.01
  • International TC: TC 47

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