Standard

IEC 60749-7:2002 ED1

Apr 2002 Revised

Note: Latest version: IEC 60749-7:2011 ED2

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases Revised IEC 60749-7:2002/COR1:2003 ED1 Corrigendum from Publication date: Aug 2003 Language: English/French Services: Online, Online + Pdf

Abstract

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. The contents of the corrigendum of August 2003 have been included in this copy.

Products specifications

Standard from IEC
Published: April 9 2002
Withdrawn: June 17 2011
Edition: 1
Document type: IS
Pages
ISBN: 2831862760

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

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Revised by: IEC 60749-7:2011 ED2
Partially replaces: IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2
Partially replaces: IEC 60749:1996 ED2

IEC 60749-7:2002 ED1

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IEC 60749-7:2011 ED2