Standard

IEC 60749:1984 ED1

Dec 1984 Revised

Note: Latest version: IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2

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Language English/French

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Amendment 2 - Semiconductor devices - Mechanical and climatic test methods. Revised IEC 60749:1984/AMD2:1993 ED1 Amendment from Publication date: Sep 1993 Pages: 31 Language: English/French Services: Online, Online + Pdf
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods. Revised IEC 60749:1984/AMD1:1991 ED1 Amendment from Publication date: Dec 1991 Pages: 33 Language: English/French Services: Online, Online + Pdf

Abstract

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Products specifications

Standard from IEC
Published: December 30 1984
Withdrawn: October 28 1996
Edition: 1
Document type: IS
Pages
ISBN: 2831810604

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

Product Relations

Revised by: IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2
Revised by: IEC 60749:1996 ED2
Replaces: IEC 60147-5A:1981 ED1
Replaces: IEC 60147-5:1977 ED1

IEC 60749:1984 ED1

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IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2

IEC 60749:1996 ED2