Standard

IEC 60749-13:2002 ED1

Apr 2002 Revised

Note: Latest version: IEC 60749-13:2018 ED2

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere Revised IEC 60749-13:2002/COR1:2003 ED1 Corrigendum from Publication date: Aug 2003 Language: English/French Services: Online, Online + Pdf

Abstract

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Products specifications

Standard from IEC
Published: April 12 2002
Withdrawn: February 15 2018
Edition: 1
Document type: IS
Pages
ISBN: 2831862787

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

Product Relations

Revised by: IEC 60749-13:2018 ED2
Partially replaces: IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2
Replaces: IEC PAS 62183:2000 ED1
Partially replaces: IEC 60749:1996 ED2

IEC 60749-13:2002 ED1

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IEC 60749-13:2018 ED2