Standard

IEC 60749-24:2004 ED1

Mar 2004 Current

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Abstract

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Products specifications

Standard from IEC
Published: March 9 2004
Edition: 1
Document type: IS
Pages
ISBN: 283187419X

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

Product Relations

Replaces: IEC PAS 62336:2002 ED1
Partially replaces: IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2
Partially replaces: IEC 60749:1996 ED2

IEC 60749-24:2004 ED1

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