Standard

IEC 62396-2:2017 ED2

Dec 2017 Current

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Language English

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Abstract

IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.

Products specifications

Standard from IEC
Published: December 15 2017
Edition: 2
Document type: IS
Pages
ISBN: 9782832250983

Publisher: IEC
Distributor: IEC
ICS: 03.100.50
ICS: 31.020
ICS: 49.060
International TC: TC 107

Product Relations

Revises: IEC 62396-2:2012 ED1
Revises: IEC TS 62396-2:2008 ED1
Revises: IEC PAS 62396-2:2007 ED1
Adopted by: NF EN 60317-0-2:2000
Adopted by: SN EN 60317-0-2:1998

IEC 62396-2:2017 ED2

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