Standard

IEC 62396-2:2012 ED1

Sep 2012 Revised

Note: Latest version: IEC 62396-2:2017 ED2

Existing or new amendments and versions must be purchased separately.

Language English

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Abstract

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2: - additional information on heavy ion data, neutron and proton data and thermal neutron data; - updates with regard to neutron sources: additional radiation simulators; - addition of the Anita spallation neutron source; - additional information on whole system and equipment testing; - comparison between accelerator based neutron sources.

Products specifications

Standard from IEC
Published: September 27 2012
Withdrawn: December 15 2017
Edition: 1
Document type: IS
Pages
ISBN: 9782832203897

Publisher: IEC
Distributor: IEC
ICS: 03.100.50
ICS: 31.020
ICS: 49.060
International TC: TC 107

Product Relations

Revised by: IEC 62396-2:2017 ED2
Replaces: IEC TS 62396-2:2008 ED1

IEC 62396-2:2012 ED1

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IEC 62396-2:2017 ED2