Standard

IEC PAS 62396-2:2007 ED1

Sep 2007 Replaced

Existing or new amendments and versions must be purchased separately.

Language English

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Abstract

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Products specifications

Standard from IEC
Published: September 18 2007
Withdrawn: August 19 2008
Edition: 1
Document type: PAS
Pages
ISBN: 2831892023

Publisher: IEC
Distributor: IEC
ICS: 03.100.50
ICS: 31.020
ICS: 49.060
International TC: TC 107

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Revised by: IEC 62396-2:2017 ED2
Replaced by: IEC TS 62396-2:2008 ED1

IEC PAS 62396-2:2007 ED1

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Abstract

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Product Relations

Product life cycle