Standard

IEC PAS 62336:2002 ED1

Aug 2002 Replaced

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Language English

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Abstract

Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Products specifications

Standard from IEC
Published: August 15 2002
Withdrawn: March 9 2004
Edition: 1
Document type: PAS
Pages
ISBN: 2831865271

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

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Replaced by: IEC 60749-24:2004 ED1

IEC PAS 62336:2002 ED1

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Abstract

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Abstract

Products specifications

Product Relations

Product life cycle