Standard

IEEE 299-2006

Withdrawn

Existing or new amendments and versions must be purchased separately.

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Abstract

Revision Standard - Inactive-Reserved. Uniform measurement procedures and techniques are provided for determining the effectiveness of electromagnetic shielding enclosures at frequencies from 9 kHz to 18 GHz (extendable to 50 Hz and 100 GHz, respectively) for enclosures having all dimension greater than or equal to 2.0 m. The types of enclosures covered include, but are not limited to, single-shield or double-shield structures of various construction, such as bolted demountable, welded, or integral with a building; and made of materials such as steel plate, copper or aluminum sheet, screening, hardware cloth,metal foil,or shielding fabrics.

Products specifications

  • Standard from IEEE
  • Published:
  • Withdrawn:
  • Document type: IS
  • Pages
  • Publisher: IEEE
  • Distributor: IEEE
  • ICS: 33.100.10
  • National Committee: IEEE Electromagnetic Compatibility Society / Standards Development Committee

Product Relations

  • Referred by: IEEE 2716-2022
  • Referred by: IEEE 2715-2023
  • Referred by: IEEE 1302-2019
  • Referred by: IEEE 299.1-2013
  • Referred by: IEEE 299.1-2013
  • Referred by: IEEE 1302-2008
  • Referred by: IEEE C63.9-2008
  • Refers: IEEE C95.1-2005
  • Referred by: IEEE 1560-2005
  • Revises: IEEE 299-1997
  • Refers: IEEE 291-1991
  • Refers: IEEE 473-1985
  • Refers: ANSI/NCSL Z540-2:1997-American Nation Standard fo Expressing Uncertainty -- U.S. Guide to the Expression of Uncertainty in Measurement, National Conference fo Standards Laboratories
  • Refers: ISO/IEC 17025:1999-General requirements for the competence of testing and calibration and testing laboratories
  • Refers: ANSI C63.2-1996-American Standard for Electromagnetic Noise and Field Strength Instrumentation, 10 kHz to 40 GHz--Specifications
  • Refers: LAB 34: Edition 1, 2002-The Expression of Uncertainty in EMC testing, United Kingdom Accreditation Service (UKAS)
  • Refers: NIST TN 1297:1994-Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results, Barry N. Taylor and Chris E. Kuyatt