Standard

IEEE C63.9-2008

Current

Existing or new amendments and versions must be purchased separately.

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Abstract

New IEEE Standard - Active. Draft Version 3.4. This standard provides recommended test methods and limits for assuring the RF immunity of office equipment to general use transmitters with transmitter power up to 8 watts.

Products specifications

  • Standard from IEEE/ANSI
  • Published:
  • Document type: IS
  • Pages
  • Publisher: IEEE/ANSI
  • Distributor: IEEE/ANSI
  • ICS: 33.100.20
  • National Committee: IEEE Aerospace and Electronic Systems Society / Gyro Accelerometer Panel

Product Relations

  • Referred by: IEEE C63.14-2014
  • Referred by: IEEE C63.14-2014
  • Refers: IEEE 299-2006
  • Refers: IEEE 1309-2005
  • Refers: IEEE 269-2002
  • Refers: IEEE 1329-1999
  • Refers: ANSI C63.4-2003-American National Standard Methods of Measurement of Radio-Noise Emission from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz.
  • Refers: ANSI C63.19-2007-American National Standard for Methods of Measurement of Compatibility between Wireless Communications Devices and Hearing Aids.
  • Refers: UKAS LAB34, edition 1-The Expression of Uncertainty in EMC Testing, August 2002.
  • Refers: IEC 61000 4-3 (2002-09)-Electromagnetic Compatibility for Electrical and Electronic Equipment—Part 4: Testing and Measurement Techniques—Section 3: Radiated, Radio Frequency, Electromagnetic Field Immunity Test.
  • Refers: ANSI C63.14-1998-American National Standard Dictionary for Electromagnetic Compatibility (EMC), Electromagnetic Pulse (EMP), and Electrostatic Discharge (ESD) (Dictionary of EMC/EMP/ESD Terms and Definitions).
  • Refers: EN 55024-Information Technology Equipment—Immunity Characteristics—Limits and Methods of Measurement.
  • Refers: IEC 61000-4-20 (2003-01)-Electromagnetic compatibility (EMC)—Part 4-20: Testing and measurement techniques—Emission and immunity testing in transverse electromagnetic (TEM) waveguides.
  • Refers: CISPR 24 Ed. 1.0- Information technology equipment—Immunity characteristics—Limits and methods of measurement.