Standard

IEEE 1149.4-2010

Mar 2011 Withdrawn

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Language English

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Abstract

Revision Standard - Inactive-Reserved. The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.

Products specifications

Standard from IEEE
Published: March 18 2011
Withdrawn: March 25 2021
Document type: IS
Pages
ISBN: 978-0-7381-6523-3

Publisher: IEEE
Distributor: IEEE
ICS: 31.180
National Committee: IEEE Computer Society / Test Technology

Product Relations

Referred by: IEEE 1149.6-2015
Referred by: IEEE 1149.1-2013
Referred by: IEEE 1149.1-2013
Refers: IEEE 1149.1-2001
Revises: IEEE 1149.4-1999

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Version history History (2)

IEEE 1149.4-2010

IEEE 1149.4-1999

Abstract

Products specifications

Product Relations