Standard

IEEE 1149.4-1999

Mar 2000 Revised

Note: Latest version: IEEE 1149.4-2010

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Language English

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Abstract

New IEEE Standard - Superseded. The testability structure for digital circuits described in IEEE Std 1149.1-1990 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration.

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Standard from IEEE
Published: March 20 2000
Document type: IS
Pages
ISBN: 978-0-7381-1756-0

Publisher: IEEE
Distributor: IEEE
ICS: 31.180
National Committee: IEEE Computer Society / Test Technology

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Revised by: IEEE 1149.4-2010
Referred by: IEEE 1149.1-2001

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Version history History (2)

IEEE 1149.4-2010

IEEE 1149.4-1999

Abstract

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