IEC TS 62396-5:2008 ED1


Existing or new amendments and versions must be purchased separately.



IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).

Products specifications

  • Standard from IEC
  • Published:
  • Withdrawn:
  • Edition: 1
  • Document type: TS
  • Pages
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 03.100.50
  • ICS: 31.020
  • ICS: 49.060
  • International TC: TC 107

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