Standard

IEC PAS 62396-5:2007 ED1

Sep 2007 Replaced

Existing or new amendments and versions must be purchased separately.

Language English

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Abstract

Provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset in microelectronics.

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Standard from IEC
Published: September 18 2007
Withdrawn: August 19 2008
Edition: 1
Document type: PAS
Pages
ISBN: 2831892066

Publisher: IEC
Distributor: IEC
ICS: 03.100.50
ICS: 31.020
ICS: 49.060
International TC: TC 107

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Replaced by: IEC TS 62396-5:2008 ED1

IEC PAS 62396-5:2007 ED1

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Abstract

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Abstract

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Product life cycle