Standard

IEC 60749-4:2017 ED2

Mar 2017 Current

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Abstract

IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition: a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1; b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage; c) allowance of additional time-to-test delay or return-to-stress delay.

Products specifications

Standard from IEC
Published: March 3 2017
Edition: 2
Document type: IS
Pages
ISBN: 9782832240021

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

Product Relations

Revises: IEC 60749-4:2002 ED1

IEC 60749-4:2017 ED2

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