Standard

IEC TS 62396-5:2008 ED1

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Résumé

IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).

Spécifications des produits

  • Standard de IEC
  • Publié:
  • Radié:
  • Version: 1
  • Type de document: TS
  • Pages
  • Editeur: IEC
  • Distributeur: IEC
  • ICS: 03.100.50
  • ICS: 31.020
  • ICS: 49.060
  • Comité international: TC 107

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