Standard

SAE J1752/3_199503

Mar 1995 Withdrawn

Note: Latest version: SAE J1752/3_201709

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Abstract

This SAE Recommended Practice defines a method for measuring the electromagnetic radiation from an integrated circuit. The method uses a standardized IC test board containing the IC being evaluated mounted to a mating port cut in the top or bottom of a 1 GHz TEM cell. The standardized test board controls the geometry and orientation of the operating IC relative to the TEM cell and eliminates any connecting leads within the cell (these are on the back side of the board which is outside the cell). One of the TEM cell feeds is terminated with a 50 Ω load and the other one is connected to the input of a spectrum analyzer which measures the RF emissions over the frequency range of 150 kHz to 1000 MHz emanating from the integrated circuit and impressed onto the septum of the TEM cell (see Figure 1 ).

Products specifications

Standard from SAE International
Published: March 1 1995
Withdrawn: January 21 2003
Document type: IS
Pages
ISBN:

Publisher: SAE International
Distributor: SAE International

Product Relations

Refers: SAE J1752/1_201605
Refers: SAE J1113/1_201310
Replaced by: SAE J1752/3_200301

SAE J1752/3_199503

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SAE J1752/3_201709

SAE J1752/3_201106

SAE J1752/3_200301