Standard

SAE J1752/2_199503

Mar 1995 Withdrawn

Note: Latest version: SAE J1752/2_201609

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Language English

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Abstract

This SAE Recommended Practice defines a method for evaluating the near field magnetic component of the electromagnetic radiation from an integrated circuit. The method uses a shielded, single turn loop as a probe to measure magnetic emissions from 1 to 1000 MHz at a controlled distance and orientation from an integrated circuit. The method primarily measures the magnetic field generated by IC current loops perpendicular to the IC surface in the lead frame. This document is applicable to measurements from an individual IC mounted on a standardized test board or in-situ on a circuit board. Comparisons using the IC emissions reference levels require using identical circuit boards or the standardized IC test board.

Products specifications

Standard from SAE International
Published: March 1 1995
Withdrawn: January 21 2003
Document type: IS
Pages
ISBN:

Publisher: SAE International
Distributor: SAE International

Product Relations

Refers: SAE J1752/1_201605
Refers: SAE J1113/1_201310
Replaced by: SAE J1752/2_200301

SAE J1752/2_199503

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SAE J1752/2_201609

SAE J1752/2_201106

SAE J1752/2_200301