Standard

IEEE 592-1977

Nov 1977 Revised

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Abstract

New IEEE Standard - Superseded. IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.

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Standard from IEEE
Published: November 29 1977
Document type: IS
Pages
ISBN: 978-0-7381-4388-0

Publisher: IEEE
Distributor: IEEE
ICS: 29.120.20
National Committee: IEEE Power and Energy Society / Insulated Conductors

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Referred by: IEEE 404-1986
Revised by: IEEE 592-1990

IEEE 592-1977

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IEEE 592-2018

IEEE 592-2007

IEEE 592-1990

IEEE 592-1977

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