Standard

IEEE 300-1982

Nov 1992 Revised

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Abstract

Revision Standard - Superseded. The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard are mandatory, but tests which are used to specify performance shall be performed in accordance with the procedures described herein.

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Standard from ANSI/IEEE
Published: November 10 1992
Document type: IS
Pages
ISBN: 978-1-5044-0276-7

Publisher: ANSI/IEEE
Distributor: ANSI/IEEE
National Committee: /

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Referred by: IEEE 325-1986
Revises: IEEE 300-1969

IEEE 300-1982

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IEEE 300-1982

IEEE 300-1988

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IEEE 300-1982

IEEE 300-1988

IEEE 300-1969

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