Consolidated

IEC 60115-1:1999+AMD1:2001 CSV ED3.1

May 2001 Revised

Note: Latest version: IEC 60115-1:2020 ED5

Existing or new amendments and versions must be purchased separately.

Language English

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Abstract

Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This consolidated version consists of the third edition (1999) and its amendment 1 (2001). Therefore, no need to order amendment in addition to this publication.

Products specifications

Consolidated from IEC
Published: May 28 2001
Withdrawn: July 21 2008
Edition: 3.1
Document type: IS
Pages
ISBN:

Publisher: IEC
Distributor: IEC
ICS: 31.040.10
International TC: TC 40

Product Relations

Revised by: IEC 60115-1:2008 ED4
Revises: IEC 60115-1:1982 ED2

IEC 60115-1:1999+AMD1:2001 CSV ED3.1

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IEC 60115-1:2020 ED5

IEC 60115-1:2008 ED4