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Standard

IEEE 759-1984

Withdrawn
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Abstract

New IEEE Standard - Inactive-Withdrawn. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.

Products specifications

  • Standard from IEEE
  • Published:
  • Withdrawn:
  • Document type: IS
  • Pages
  • Publisher: IEEE
  • Distributor: IEEE
  • ICS: 17.240
  • National Committee: IEEE Nuclear and Plasma Sciences Society / Nuclear Instruments and Detectors

Product Relations

  • Referred by: IEEE 1160-1993
  • Refers: IEEE 300-1988
  • Referred by: IEEE 325-1986
  • Refers: IEEE 301-1976
  • Refers: IEC Publication 430 (1973), Test Procedures for Germanium Gamma-Ray Detectors.
  • Refers: IEC Publication 333 (1983), Test Procedures for Semiconductor Detectors
  • Refers: IEC Publication 340 (1979) (Second Edition), Test Procedures for Amplifiers and Preamplifier for Semiconductor Detectors for Ionizing Radiation.