Standard

IEEE 1687-2014

Dec 2014 Current

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Language English

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Abstract

New IEEE Standard - Active. A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

Products specifications

Standard from IEEE
Published: December 5 2014
Document type: IS
Pages
ISBN: 978-0-7381-9416-5

Publisher: IEEE
Distributor: IEEE
ICS: 31.180
ICS: 31.200
National Committee: IEEE Computer Society / Test Technology

Product Relations

Referred by: IEEE 1500-2022
Referred by: IEEE 1838-2019
Refers: IEEE 1149.1-2013
Refers: IEEE 1500-2005
Refers: IEEE 1149.1-2001

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Version history Related Corrigenda and Amendments (0)

Abstract

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Product Relations