Standard

IEEE 1581-2011

Jun 2011 Withdrawn

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Language English

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Abstract

New IEEE Standard - Inactive-Reserved. IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1(TM)) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.

Products specifications

Standard from IEEE
Published: June 20 2011
Withdrawn: March 24 2022
Document type: IS
Pages
ISBN: 978-0-7381-6613-1

Publisher: IEEE
Distributor: IEEE
ICS: 31.200
National Committee: IEEE Computer Society / Test Technology

Product Relations

Refers: IEEE 1149.1-2001

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Abstract

Products specifications

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