Standard

IEC PAS 62205:2000 ED1

Nov 2000 Replaced

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Abstract

Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.

Products specifications

Standard from IEC
Published: November 28 2000
Withdrawn: July 1 2002
Edition: 1
Document type: PAS
Pages
ISBN: 2831854814

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

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Replaced by: IEC 60749-6:2002 ED1

IEC PAS 62205:2000 ED1

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Abstract

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Product life cycle