Standard

IEC PAS 62191:2000 ED1

Nov 2000 Replaced

Existing or new amendments and versions must be purchased separately.

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Abstract

Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.

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Standard from IEC
Published: November 28 2000
Withdrawn: January 31 2002
Edition: 1
Document type: PAS
Pages
ISBN: 2831854695

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

IEC PAS 62191:2000 ED1

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Abstract

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Abstract

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