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IEEE 1687-2014

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Résumé

New IEEE Standard - Active. A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

Spécifications des produits

  • Standard de IEEE
  • Publié:
  • Type de document: IS
  • Pages
  • Editeur: IEEE
  • Distributeur: IEEE
  • ICS: 31.180
  • ICS: 31.200
  • Comité national: IEEE Computer Society / Test Technology

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