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Standard

IEEE 759-1984

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New IEEE Standard - Inactive-Withdrawn. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.

Specifiche dei prodotti

  • Standard da IEEE
  • Pubblicato:
  • Ritirato:
  • Tipo di documento: IS
  • Pagine
  • Publisher IEEE
  • Distributor IEEE
  • ICS 17.240
  • National Committee IEEE Nuclear and Plasma Sciences Society / Nuclear Instruments and Detectors

Relazioni con i prodotti

  • Riferito da: IEEE 1160-1993
  • Riferimenti: IEEE 300-1988
  • Riferito da: IEEE 325-1986
  • Riferimenti: IEEE 301-1976
  • Riferimenti: IEC Publication 430 (1973), Test Procedures for Germanium Gamma-Ray Detectors.
  • Riferimenti: IEC Publication 333 (1983), Test Procedures for Semiconductor Detectors
  • Riferimenti: IEC Publication 340 (1979) (Second Edition), Test Procedures for Amplifiers and Preamplifier for Semiconductor Detectors for Ionizing Radiation.