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Standard

IEEE 1687-2014

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Astratto

New IEEE Standard - Active. A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language to describe this network, and a software language and protocol for communicating with the instruments via this network.

Specifiche dei prodotti

  • Standard da IEEE
  • Pubblicato:
  • Tipo di documento: IS
  • Pagine
  • Publisher IEEE
  • Distributor IEEE
  • ICS 31.180
  • ICS 31.200
  • National Committee IEEE Computer Society / Test Technology

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