Standard

ISO 19668:2017

Actuel

Amendements et versions existants ou nouveaux doivent être achetés séparément.

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Résumé

ISO 19668:2017 specifies a procedure by which elemental detection limits in X-ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique.

Spécifications des produits

  • Standard de ISO
  • Publié:
  • Version: 1
  • Type de document: IS
  • Pages
  • Editeur: ISO
  • Distributeur: ISO
  • ICS: 71.040.40
  • Comité international: ISO/TC 201/SC 7