Standard

SN EN ISO 16526-1:2020

Sep 2020 Current

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Abstract

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system. This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

Products specifications

Standard from INB
Published: September 1 2020
Effective: September 1 2020
Document type: EN
Pages
ISBN:

ICS: 19.100
Publisher: SNV
Distributor: SNV
National Committee: INB/NK 180
European TC: CEN/TC 138

Product Relations

Adopted from: ISO 16526-1:2011, IDT
Replaces: SN EN 12544-2:2000
Replaces: SN EN 12544-1:1999
Replaces: SN EN 12544-3:1999

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