Standard

ISO TS 22292:2021 ED1

Current

Existing or new amendments and versions must be purchased separately.

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Abstract

ISO TS 22292:2021 This document provides guidance for sample preparation, data acquisition by transmission electron microscopy, data processing, and three-dimensional image reconstruction to measure size and shape parameters of nano-objects on rod-shaped supports. The method is applicable to samples dispersed on or within an electron-transparent rod-shaped support.

Products specifications

  • Standard from IEC
  • Published:
  • Edition: 1
  • Document type: TS
  • Pages
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 37.020
  • ICS: 07.120
  • International TC: TC 113