Standard

ISO/TS 17915:2013

Jun 2013 Withdrawn

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Abstract

ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.

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Standard from ISO
Published: June 25 2013
Withdrawn: May 25 2018
Edition: 1
Document type: TS
Pages
ISBN:

Publisher: ISO
Distributor: ISO
ICS: 31.260
International TC: ISO/TC 172/SC 9

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Revised by: ISO 17915:2018

ISO/TS 17915:2013

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