ISO/TS 11888:2011


Note: Latest version: ISO/TS 11888:2017

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ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis. ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL. Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

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  • Standard from ISO
  • Published:
  • Withdrawn:
  • Edition: 1
  • Document type: TS
  • Pages
  • Publisher: ISO
  • Distributor: ISO
  • ICS: 07.120
  • International TC: ISO/TC 229

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