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ISO/TS 11888:2011

Nov 2011 Withdrawn

Note: Latest version: ISO/TS 11888:2017

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Abstract

ISO/TS 11888:2011 describes methods for the characterization of mesoscopic shape factors of multiwall carbon nanotubes (MWCNTs). Techniques employed include scanning electron microscopy, transmission electron microscopy, viscometry, and light scattering analysis. ISO/TS 11888:2011 also includes additional terms needed to define the characterization of scattered bending persistence length (SBPL). Two approximation methods are given for the evaluation of SBPL. Well-established concepts and mathematical expressions, analogous to polymer physics, are utilized for the definition of mesoscopic shape factors of MWCNTs.

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Standard from ISO
Published: November 8 2011
Withdrawn: July 12 2017
Edition: 1
Document type: TS
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Publisher: ISO
Distributor: ISO
ICS: 07.120
International TC: ISO/TC 229

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Revised by: ISO/TS 11888:2017

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ISO/TS 11888:2011

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ISO/TS 11888:2017

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