Standard

ISO 17915:2018

May 2018 Current

Existing or new amendments and versions must be purchased separately.

Language English

Services Online + Pdf CHF 159,00 Online CHF 136,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications. This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Products specifications

Standard from ISO
Published: May 25 2018
Edition: 1
Document type: IS
Pages
ISBN:

Publisher: ISO
Distributor: ISO
ICS: 31.260
International TC: ISO/TC 172/SC 9

Product Relations

Revises: ISO/TS 17915:2013

ISO 17915:2018

Create subscription

ISO 17915:2018

ISO/TS 17915:2013

Abstract

Products specifications

Product Relations

Product life cycle

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Version history History (2)

ISO 17915:2018

ISO/TS 17915:2013

Abstract

Products specifications

Product Relations

Product life cycle