Standard

ISO 17901-1:2015

Jun 2015 Current

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Language English

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Abstract

ISO 17901-1:2015 specifies the terms related to optical characteristics of holograms, the method to measure their diffraction efficiency, and the angular and wavelength selectivity measurement methods. These measurement methods are applicable to any type of hologram if the hologram yields a simple diffraction pattern, which means the reconstructed wave can be clearly separated from other diffracted and non-diffracted waves. In other words, holograms that yield complex diffraction patterns are excluded. There are no restrictions on the materials used to form the holograms.

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Standard from ISO
Published: June 29 2015
Edition: 1
Document type: IS
Pages
ISBN:

Publisher: ISO
Distributor: ISO
ICS: 31.020
International TC: ISO/TC 172/SC 9

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Abstract

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