Standard

ISO 11505:2012

Dec 2012 Current

Note: Now under development: ISO/PRF 11505

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Abstract

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

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Standard from ISO
Published: December 12 2012
Edition: 1
Document type: IS
Pages
ISBN:

Publisher: ISO
Distributor: ISO
ICS: 71.040.40
International TC: ISO/TC 201/SC 8

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Revised by: ISO/PRF 11505
Revised by: ISO/PRF 11505

ISO 11505:2012

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Abstract

Products specifications

Product Relations

Product life cycle