Standard

IEEE 1671.1-2009

Dec 2009 Revised

Note: Latest version: IEEE 1671.1-2017

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Language English

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Abstract

New IEEE Standard - Superseded. This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.

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Standard from IEEE
Published: December 11 2009
Document type: IS
Pages
ISBN: 978-0-7381-6066-5

Publisher: IEEE
Distributor: IEEE
ICS: 35.240.30
National Committee: IEEE SA Board of Governors / SCC20 - Test and Diagnosis for Electronic Systems

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Revised by: IEEE 1671.1-2017
Refers: IEEE 1671-2006
Refers: IEEE 1641-2004

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Version history History (3)

IEEE 1671.1-2017

IEEE 1671.1-2009

IEEE 1671.1-2009

Abstract

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