Standard

IEEE 1636.2-2010

Feb 2013 Revised

Note: Latest version: IEEE 1636.2-2018

Existing or new amendments and versions must be purchased separately.

Language English

Services Online + Pdf CHF 111.00 Online CHF 95.00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

New IEEE Standard - Superseded. Interoperability between components of automatic test systems (ATS) is promoted and facilitated. The standard facilitates the capture of maintenance action information (MAI) associated with the removal, repair, and replacement of a particular system component (e.g., unit(s) under test) in order to maintain/support that particular operational system. The MAI schema becomes a class of information that can be used within the SIMICA family of standards. The exchange format utilizes the XML formats.

Products specifications

Standard from IEEE
Published: February 1 2013
Document type: IS
Pages
ISBN: 978-0-7381-8164-6

Publisher: IEEE
Distributor: IEEE
ICS: 35.040
National Committee: IEEE SA Board of Governors / SCC20 - Test and Diagnosis for Electronic Systems

Product Relations

Revised by: IEEE 1636.2-2018
Refers: IEEE 1636-2009
Referred by: IEEE 1636-2009
Refers: IEEE 1671.3-2007
Refers: IEEE 1636.1-2007
Refers: IEEE 1671-2006
Refers: IEEE 1232-2002

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Version history History (3)

IEEE 1636.2-2018

IEEE 1636.2-2010

IEEE 1636.2-2010

Abstract

Products specifications

Product Relations