Standard

IEC TS 62804-2:2022 ED1

Mar 2022 Current

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Language English

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Abstract

IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID. This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.

Products specifications

Standard from IEC
Published: March 29 2022
Edition: 1
Document type: TS
Pages
ISBN: 9782832243794

Publisher: IEC
Distributor: IEC
ICS: 27.160
International TC: TC 82

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Adopted by: NF EN 60456:2005
Adopted by: NF EN 60456:2005
Adopted by: SN EN 60456:1999

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Abstract

Products specifications

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