Standard

IEC TS 62607-6-6:2021 ED1

Oct 2021 Current

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Language English

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Abstract

IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic • strain uniformity for single-layer graphene by • Raman spectroscopy. The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.

Products specifications

Standard from IEC
Published: October 14 2021
Edition: 1
Document type: TS
Pages
ISBN: 9782832243053

Publisher: IEC
Distributor: IEC
ICS: 07.120
International TC: TC 113

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Abstract

Products specifications