Standard

IEC TS 62607-6-4:2016 ED1

Sep 2016 Revised

Note: Latest version: IEC TS 62607-6-4:2024 ED2

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Abstract

IEC TS 62607-6-4:2016(E) establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.

Products specifications

Standard from IEC
Published: September 28 2016
Withdrawn: February 28 2024
Edition: 1
Document type: TS
Pages
ISBN: 9782832236673

Publisher: IEC
Distributor: IEC
ICS: 07.120
International TC: TC 113

Product Relations

Revised by: IEC TS 62607-6-4:2024 ED2
Adopted by: NF EN 60352-1:1998
Adopted by: SN EN 60352-1:1997

IEC TS 62607-6-4:2016 ED1

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IEC TS 62607-6-4:2024 ED2