Standard

IEC TS 62607-5-3:2020 ED1

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Abstract

IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.

Products specifications

  • Standard from IEC
  • Published:
  • Edition: 1
  • Document type: TS
  • Pages
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 07.030
  • ICS: 07.120
  • International TC: TC 113