Standard

IEC TS 61994-4-4:2010 ED2

Jun 2010 Revised

Note: Latest version: IEC TS 61994-4-4:2018 ED3

Existing or new amendments and versions must be purchased separately.

Language English

Services Online + Pdf CHF 84,00 Online CHF 72,00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

IEC 61994-4-4:2010(E) specifies the terms and definitions for single crystal wafers applied for surface acoustic wave (SAW) devices representing the state of the art, which are intended for use in the standards and documents of IEC technical committee 49. This second edition cancels and replaces the first edition published in 2005. The main changes with respect to the previous edition are listed below: - Terms and definitions are rearranged in accordance with the order of the alphabet. - "reduced LN" is appended to terms and definitions. - "reduced LT" is appended to terms and definitions. - reduction process is appended to terms and definitions.

Products specifications

Standard from IEC
Published: June 24 2010
Withdrawn: November 16 2018
Edition: 2
Document type: TS
Pages
ISBN: 9782889120222

Publisher: IEC
Distributor: IEC
ICS: 01.040.31
ICS: 31.140
International TC: TC 49

Product Relations

Revised by: IEC TS 61994-4-4:2018 ED3
Revised by: IEC TS 61994-4-4:2018 RLV
Revises: IEC TS 61994-4-4:2005 ED1
Adopted by: NF EN 60873:1993
Adopted by: SN EN 60873:1993
Adopted by: NF C46-410:1989

Product life cycle

Previous product

Revised

IEC TS 61994-4-4:2005 ED1
Current product

Revised

IEC TS 61994-4-4:2010 ED2
Stage 99.60
Revised by

Current

IEC TS 61994-4-4:2018 ED3

Current

IEC TS 61994-4-4:2018 RLV

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Version history History (3)

IEC TS 61994-4-4:2018 ED3