Standard

IEC PAS 62189:2000 ED1

Nov 2000 Replaced

Existing or new amendments and versions must be purchased separately.

Language English

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Abstract

This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.

Products specifications

Standard from IEC
Published: November 28 2000
Withdrawn: February 23 2004
Edition: 1
Document type: PAS
Pages
ISBN: 2831854679

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

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Replaced by: IEC 60749-23:2004+AMD1:2011 CSV
Replaced by: IEC 60749-23:2004 ED1

IEC PAS 62189:2000 ED1

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Abstract

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Abstract

Products specifications

Product Relations

Product life cycle