Standard

IEC PAS 62162:2000 ED1

Aug 2000 Replaced

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Abstract

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

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Standard from IEC
Published: August 22 2000
Withdrawn: May 3 2017
Edition: 1
Document type: PAS
Pages
ISBN: 2831852889

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

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Replaced by: IEC 60749-28:2017 ED1

IEC PAS 62162:2000 ED1

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Abstract

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