Standard

IEC 62525:2007 ED1

Nov 2007 Current

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Language English

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Abstract

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

Products specifications

Standard from IEEE
Published: November 7 2007
Edition: 1
Document type: IS
Pages
ISBN: 2831893372

Publisher: IEEE
Distributor: IEEE
ICS: 19.080
ICS: 25.040.01
International TC: TC 91

Extended editions Extended editions (0)

Version history Related Corrigenda and Amendments (0)

Abstract

Products specifications