Standard

IEC 62220-1:2003 ED1

Oct 2003 Replaced

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Abstract

Specifies the method for the determination of the detective quantum efficiency (DQE) of digital X-ray imaging devices as a function of exposure and of spatial frequency for the working conditions in the range of the medical application as specified by the manufacturer. Is applicable to projection digital X-ray imaging devices producing images in digital format that are used for medical diagnosis. It is restricted to digital X-ray imaging devices that are used for radiographic imaging, such as CR systems, selenium-based systems, flat panel detectors, optically coupled CCD detectors, and digital X-ray image intensifiers used for single exposures.

Products specifications

Standard from IEC
Published: October 23 2003
Withdrawn: March 12 2015
Edition: 1
Document type: IS
Pages
ISBN: 2831872006

Publisher: IEC
Distributor: IEC
ICS: 11.040.50
International TC: TC 62/SC 62B

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Replaced by: IEC 62220-1-1:2015 ED1

IEC 62220-1:2003 ED1

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Abstract

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Abstract

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Product life cycle