Standard

IEC 62047-2:2006 ED1

Current

Existing or new amendments and versions must be purchased separately.

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Abstract

Specifies the method for tensile testing of thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for micro-electromechanical systems (MEMS), micromachines and similar devices. The main structural materials for MEMS, micromachines and similar devices have special features such as typical dimensions in the order of a few microns, a material fabrication by deposition, and a test piece fabrication by non-mechanical machining using etching and photolithography. This International Standard specifies the testing method, which enables a guarantee of accuracy corresponding to the special features.

Products specifications

  • Standard from IEC
  • Published:
  • Edition: 1
  • Document type: IS
  • Pages
  • ISBN: 2831887674
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 31.080.99
  • International TC: TC 47/SC 47F